[Technological Innovation] Shaanxi Chuangyu Technology's "Magnetic Spring Testing Probe" Patent Achieved, Solving the Challenge of Semiconductor Test Lifespan

Published on: October 10,2024 Correspondent: Sun Wenjuan

On September 30,2024, Shaanxi Chuangyu Technology, a specialist in precision test connection technology, received official patent authorization (Patent No.: ZL 2024 2 2392000.2) from the China National Intellectual Property Administration for its self-developed "Magnetic Spring Test Probe". This innovation replaces traditional mechanical springs with a magnetic rebound mechanism, fundamentally addressing the industry's pain points of probe aging and short lifespan in semiconductor testing. The breakthrough provides a more reliable connection solution for chip testing processes.