Name: Single-Head Test Probe
SKU: N/A

Single-Head Test Probe

1. A single-headed test probe is one with a contact head (such as claw-shaped acorn tip, tooth head, or flat head) on one end, and the other end connected to a needle tube and elastic components (such as a spring). It consists of a needle tip, needle tube, spring, and other components.
2. Under axial thrust, the needle tip can compress the spring to achieve a shortened length, used for single-point contact testing (such as specific chip testing occasions).
3. Spacing: 0.5mm/20MiL
4. Material: Probe beryllium copper gold-plated, needle tube phosphor bronze gold-plated
5. Overall height: 3.5mm
6. Working stroke force: 0.20N@0.4mm
7. Current carrying capacity: 0.5A
8. Typical resistance: <100mOhm
9. Operating temperature: -45°C to +80°C.

Single-Head Test Probe - Precision Testing Solutions for Electronic Applications

When precision testing is critical for your electronic projects, you need reliable components that deliver consistent results. Our Single-Head Test Probe offers exceptional performance for single-point contact testing applications. This advanced testing solution features a specialized contact head design that ensures accurate electrical connections during circuit board testing. Whether you're working with PCB testing, ICT online testing, or specialized chip testing, the product provides the reliability and precision your projects demand. Built with premium materials and engineered for durability, these probes deliver outstanding performance across various testing scenarios.

Single-Head Test Probe

What Makes Our Test Probes Different

Our testing probes feature a unique design that sets them apart from standard alternatives. The contact head comes in multiple configurations including claw-shaped, acorn tip, tooth head, and flat head options. This variety ensures you can match the probe to your specific testing requirements.

The construction includes a needle tip, needle tube, spring mechanism, and elastic components that work together seamlessly. Under axial thrust, the needle tip compresses the spring to achieve shortened length. This design makes single-point contact testing more efficient and accurate.

Key Technical Specifications

Parameter	Specification
Model	CY 015A 3-20-3.5
Pitch	0.5mm/20MiL
Operating Temperature	-45°C to +80°C
Total Length	3.5mm
Barrel Diameter	0.31mm
Working Stroke	0.4mm
Spring Force	0.20N at working stroke
Current Load Capacity	0.5A
Typical Resistance	<100mOhm
Tip Diameter	0.15mm
Tip Style	Floral

Material Quality You Can Trust

We use premium materials to ensure long-lasting performance:

Component	Material
Plunger	Beryllium copper with gold plating
Barrel	Phosphor bronze with gold plating
Spring	Steel with gold plating
Tip Surface	Gold plating

The gold plating provides excellent corrosion resistance and maintains low contact resistance over thousands of testing cycles. Beryllium copper offers superior spring properties and electrical conductivity.

Applications and Benefits

These probes excel in various testing environments. You can use them for PCB testing, where they detect open circuits, short circuits, and other electrical faults. The simple structure makes replacement quick and easy, reducing downtime during testing operations.

The Single-Head Test Probe works particularly well for:

Chip testing applications
Circuit board quality control
Production line testing
Prototype validation
Research and development projects

Why Choose Our Testing Solutions

Our company, Shaanxi Chuangyu Electronic Technology Co., Ltd., specializes in precision electrical components. Located in Chang'an Innovation and Technology Industrial Park in Xi'an, we focus on electronic product research and development.

We ensure strict quality control with digital manufacturing and precision testing. Our experience across industries like energy, medical, and communications helps us understand your unique testing challenges.

Single-Head Test Probe

Custom Solutions Available

Beyond standard specifications, we offer customization services for unique applications. Our engineering team can develop non-standard probes and test fixtures to meet your specific requirements.

We can modify tip styles, adjust dimensions, or create entirely new probe designs. Our photovoltaic test probes demonstrate this capability, with minimum outer diameters reaching φ0.15mm.

Single-Head Test Probe

Reliability and Performance

Quality testing ensures each product meets stringent performance standards. Our probes maintain consistent electrical characteristics throughout their operational life.

The spring mechanism provides reliable contact force across thousands of testing cycles. Gold plating resists wear and maintains low resistance connections.

Temperature stability from -45°C to +80°C makes these probes suitable for various testing environments. Whether you're testing in cold conditions or elevated temperatures, performance remains consistent.

Single-Head Test Probe

Getting Started

Ready to improve your testing accuracy and efficiency? Our Single-Head Test Probe solutions can enhance your quality control processes. Contact our technical team for support, from consultation to implementation, with tailored probe recommendations for your testing needs.

For detailed specifications, custom solutions, or technical questions, reach out to us at postmaster@cymicrowave.com. We're here to help you achieve precise, reliable testing results.

Shaanxi Chuangyu Electronic Technology Co., Ltd. - Your partner for precision testing solutions and electronic innovation.