Name: Double-Headed Test Probe
SKU: N/A

Double-Headed Test Probe

1. A double-headed test probe has two independent probes, mainly used for electronic testing and component inspection, capable of simultaneously or separately measuring the parameters of two test points, applied in PCB testing.
2. Spacing: 0.78mm/30MiL
3. Material: Probe beryllium copper gold-plated, needle tube phosphor bronze gold-plated
4. Overall height: 10.9mm
5. Working stroke force: 0.20N@1mm
6. Current carrying capacity: 2A
7. Typical resistance: <80mOhm
8. Operating temperature: -45°C to +80°C.

Double-Headed Test Probe - Precision Testing Solutions for Modern Electronics

When you're working with complex electronic systems, having the right testing equipment can make all the difference. The Double-Headed Test Probe represents a breakthrough in precision measurement technology. This inventive dual-tip plan permits you to test different focuses at the same time, drastically making strides your testing proficiency. Our double test tips offer tall exactness and unwavering quality, with 0.78mm dispersing, perfect for requesting PCB testing environments.

Double-Headed Test Probe

What Makes Our Item Special?

Our precision-engineered tests stand out in today's competitive gadgets advertise. Each test experiences thorough quality control to guarantee steady execution over millions of test cycles.

The dual-tip design eliminates the need for multiple testing setups. You can now perform signal comparison analysis directly, saving valuable time during your testing procedures. This efficiency boost translates into higher productivity for your testing operations.

The 0.32mm tip diameter provides exceptional contact precision. Whether you're testing dense PCB layouts or conducting detailed component analysis, our probes deliver the accuracy you need.

Double-Headed Test Probe

Key Features and Benefits

Superior Multi-Point Testing Capability

The dual probe head enables simultaneous measurements at two points, improving testing efficiency and streamlining your workflow.

Exceptional Precision and Durability

Our probe tips, with 0.12mm diameter and gold/rhodium plating, offer low impedance and over 300,000 cycles of reliability.

Flexible Configuration Options

The adjustable probe spacing and angles of the Double-Headed Test Probe accommodate various testing requirements. This adaptability makes our probes suitable for diverse applications across different industries and testing scenarios.

Technical Specifications

Parameter	Specification
General Specifications
Model	CY 032A-FB-10.9
Pitch	0.78mm/30MiL
Operating Temperature	-45°C to +80°C
Material Composition
Plunger	Beryllium copper gold
Barrel	Phosphor bronze gold
Spring	Steel gold
Mechanical Properties
Total Length	10.9mm
Barrel Diameter	0.58mm
Spring Force at Working Stroke	0.20N
Working Stroke	1mm
Tip Style	Crown/Ball
Tip Diameter	0.32mm
Tip Surface Treatment	Gold plated
Electrical Characteristics
Current Load Capacity	2A
Typical Resistance	< 80mOhm

Applications Across Industries

Your testing needs span multiple industries, and our probes adapt accordingly. In the automotive sector, these probes excel in testing electronic control units and sensor systems. The precision required for automotive applications demands reliable contact and consistent measurements.

Our dual-probe technology enhances medical device manufacturing with simultaneous measurements in sterile conditions. In telecommunications, our probes ensure high-frequency performance and signal integrity for accurate testing.

Quality Assurance and Manufacturing Excellence

Shaanxi Chuangyu Electronic Technology Co., Ltd. keeps up strict generation prepare administration and utilizes accuracy testing rebellious all through fabricating. Our office in Chang'an Advancement and Innovation Mechanical Stop speaks to the cutting edge of Chinese gadgets manufacturing.

Each test experiences thorough testing for mechanical, electrical, and solidness measures. Our computerized fabricating framework guarantees steady quality from plan to last use.

Double-Headed Test Probe

Customization and Back Services

We get it that standard arrangements do not continuously meet one of a kind necessities. Our designing group specializes in creating custom test arrangements custom fitted to your particular applications. Whether you require adjusted dispersing, specialized tip geometries, or one of a kind electrical characteristics, we can oblige your needs.

Technical support extends beyond initial delivery. Our experienced engineers provide ongoing consultation to optimize your testing procedures and maximize probe performance in your specific environment.

Double-Headed Test Probe

Get Started Today

Ready to enhance your testing capabilities? Contact our technical team to discuss your specific requirements. We'll help you select the optimal Double-Headed Test Probe configuration for your applications.

For detailed technical discussions or custom probe inquiries, reach out to us at postmaster@cymicrowave.com. Our experts are ready to support your testing success with reliable, high-performance probe solutions.