CY 012A 2-08-10.5 Precision Test Probe New Product Launch

Micron-Level Precision for Micro-Scale Testing Applications

To meet the rigorous demands of sectors such as semiconductors, precision electronics, and micro-devices—specifically regarding extremely small test contact points—our company is proud to officially launch the CY 012A 2-08-10.5 Precision Test Probe. With core specifications featuring a diameter of 0.2mm and an effective length of 10.2mm, this product offers a reliable solution for high-density, fine-pitch testing scenarios through its ultra-miniaturized dimensions and stable electrical performance.
Manufactured using precision machining processes, this probe boasts exceptional dimensional consistency, stable contact, and reliable conductivity. It is ideally suited for applications such as chip testing, micro-point inspection on PCBs, connector continuity verification, and micro-sensor debugging. The probe maintains stable performance even within confined assembly spaces and during high-frequency reciprocating tests, effectively reducing contact impedance and enhancing testing accuracy.
The mass market launch of the CY 012A 2-08-10.5 further enriches our company's precision test probe product line. With its smaller diameter and enhanced adaptability, it empowers customers to boost the testing efficiency and quality control standards of their miniaturized products.
Moving forward, our company will continue to deepen its commitment to the R&D of precision probe technologies, constantly optimizing dimensional accuracy, service life, and batch consistency. Through professional-grade products and efficient services, we aim to provide increasingly competitive core component support to the high-end manufacturing and precision testing sectors.​​​